IEC 62951-2 Ed. 1.0 b:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices

standard by International Electrotechnical Commission, 04/17/2019

Full Description

IEC 62951-2:2019 specifies terms, definitions, symbols, configurations and evaluation methods that can be used to evaluate and determine the performance characteristics of flexible thinfilm transistor (TFT) devices. This document specifies test methods and characteristic parameters for accurately evaluating the performance and reliability in practical use of flexible TFT devices under the bending status.

Product Details

Edition: 1.0 Published: 04/17/2019 Number of Pages: 21 File Size: 1 file , 1.1 MB