Full Description

ANSI X9.100-30-2011 (R2017) is the specification of the optical measurement methodology for the parameters of reflectance, PCS, DCR, Paxel Count, and opacity which are needed for MICR documents.

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Published: 08/09/2011 ANSI: ANSI Approved Number of Pages: 35File Size: 1 file , 770 KB