TIA-455-130

Description / Abstract: Although the test is intended as a means to obtain a set of parameters that describe the reliability of the device population, the determination of an activation energy due to either temperature or current density is beyond the scope of this FOTP. This test is directed toward semiconductor laser diodes used in telecommunication applications for transmission or pumping purposes. Unless otherwise noted, this procedure applies to all semiconductor laser diodes that can be operated in a CW mode of operation; this includes pump lasers, direct and externally modulated lasers for both digital and analog applications. Also, this test is intended for sub-mounted (unpackaged) devices.