Full Description

New IEEE Standard - Inactive-Withdrawn.This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.

Product Details

Published: 10/07/1988 ISBN(s): 9780738142357 Number of Pages: 34File Size: 1 file , 2.6 MB Product Code(s): STDWD12195