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IEEE 592-2007

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IEEE 592-2007 IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors

standard by IEEE, 05/08/2008

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Full Description

Scope

This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.

Abstract

Revision Standard - Active.Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.

Product Details

Published: 05/08/2008 ISBN(s): 9780738153490, 9780738169743, 9780738169736, 9780738153483, 9781504410861 Number of Pages: 10File Size: 1 file , 1 MBRedline File Size:3files, 3.8 MB Product Code(s): STDRL95747, STD95747, STDPD95747, STDPDRL95747, STDPL95747