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JIS C 5443:1997Generic specification of switches for use in electronic equipmentstandard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1997
JIS C 5442:1996Test methods of low power electromagnetic relays for industrial control circuits (FOREIGN STANDARD)standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1996
JIS C 5441:1994/AMENDMENT 1:2006Testing methods of switches for use in electronic equipment (Amendment 1)Amendment by Japanese Industrial Standard / Japanese Standards Association, 01/01/2006
JIS C 5402-6-4:2005Connectors for electronic equipment -- Tests and measurements -- Part 6-4: Dynamic stress tests -- Test 6d: Vibration (sinusoidal) (FOREIGN STANDARD)standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2005
JIS C 5402-6-3:2005Connectors for electronic equipment -- Tests and measurements -- Part 6-3: Dynamic stress tests -- Test 6c: Shock (FOREIGN STANDARD)standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2005
JIS C 5402-6-2:2005Connectors for electronic equipment -- Tests and measurements -- Part 6-2: Dynamic stress tests -- Test 6b: Bump (FOREIGN STANDARD)standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2005
JIS C 5402-6-1:2005Connectors for electronic equipment -- Tests and measurements -- Part 6-1: Dynamic stress tests -- Test 6a: Acceleration, steady state (FOREIGN STANDARD)standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2005
JIS C 5402-5-2:2005Connectors for electronic equipment -- Tests and measurements -- Part 5-2: Current-carrying capacity tests -- Test 5b: Current-temperature derating (FOREIGN STANDARD)standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2005
JIS C 5402-5-1:2005Connectors for electronic equipment -- Tests and measurements -- Part 5-1: Current-carrying capacity tests -- Test 5a: Temperature rise (FOREIGN STANDARD)standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2005
JIS C 5402-4-3:2005Connectors for electronic equipment -- Tests and measurements -- Part 4-3: Voltage stress tests -- Test 4c: Voltage proof of pre-insulated crimp barrels (FOREIGN STANDARD)standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2005
JIS C 5402-4-2:2005Connectors for electronic equipment -- Tests and measurements -- Part 4-2: Voltage stress tests -- Test 4b: Partial discharge (FOREIGN STANDARD)standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2005
JIS C 5402-3-1:2005Connectors for electronic equipment -- Tests and measurements -- Part 3-1: Insulation tests -- Test 3a: Insulation resistance (FOREIGN STANDARD)standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2005