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IEEE C62.42.3-2017IEEE Guide for the Application of Surge Protective Components in Surge Protective Devices and Equipment Ports -- Part 3: Silicon PN-Junctionstandard by IEEE, 03/13/2018
IEEE C62.42.2-2022IEEE Guide for the Application of Surge-Protective Components in Surge-Protective Devices and Equipment Ports--Part 2: Metal- Oxide Varistors (MOVs)standard by IEEE, 09/16/2022
IEEE C62.42.1-2016IEEE Guide for the Application of Surge-Protective Components in Surge Protective Devices and Equipment Ports--Part 1: Gas Discharge Tubes (GDTs)standard by IEEE, 12/09/2016
IEEE C62.42.0-2016IEEE Guide for the Application of Surge-Protective Components in Surge-Protective Devices and Equipment Ports--Overviewstandard by IEEE, 09/30/2017
IEEE C62.42-2005IEEE Guide for the Application of Component Surge-Protective Devices for Use in Low-Voltage [Equal to or Less than 1000 V (ac) Or 1200 V (dc)] Circuitsstandard by IEEE, 05/31/2006
IEEE C62.42-1992IEEE Guide for the Application of Gas Tube and Air Gap Arrester Low-Voltage (Equal to or Less than 1000 V rms or 1200 V dc) Surge Protective Devicesstandard by IEEE, 05/05/1993
IEEE C62.39-2012IEEE Standard for Test Methods and Preferred Values for Self-Restoring Current-Limiter Components Used in Telecommunication Surge Protectionstandard by IEEE, 01/14/2013
IEEE C62.38-1994 [ Withdrawn ]IEEE Guide on Electrostatic Discharge (ESD): ESD Withstand Capability Evaluation Methods (for Electronic Equipment Subassemblies)standard by IEEE, 04/24/1995
IEEE C62.37.1-2012IEEE Guide for the Application of Thyristor Surge Protective Device Componentsstandard by IEEE, 04/26/2013
IEEE C62.37.1-2000IEEE Guide for the Application of Thyristor Surge Protective Devicesstandard by IEEE, 04/18/2001
IEEE C62.37-1996IEEE Standard Test Specification for Thyristor Diode Surge Protective Devicesstandard by IEEE, 01/01/1996
IEEE C62.36-2016IEEE Standard Test Methods for Surge Protectors and Protective Circuits Used in Information and Communications Technology (ICT) Circuits, and Smart Grid Data Circuitsstandard by IEEE, 11/02/2016