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IEEE 1671.4-2007
IEEE 1671.4-2007IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Informationstandard by IEEE, 04/30/2008
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IEEE 1671.3-2017IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Descriptionstandard by IEEE, 04/13/2018
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IEEE 1671.3-2017IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Descriptionstandard by IEEE, 04/13/2018
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IEEE 1671.3-2007IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Informationstandard by IEEE, 03/28/2008
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IEEE 1671.2-2012IEEE Standard for Automatic Test Markup Language (ATML) Instrument Descriptionstandard by IEEE, 02/15/2013
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IEEE 1671.2-2008IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptionsstandard by IEEE, 12/17/2008
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IEEE 1671.1-2017IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptionsstandard by IEEE, 03/19/2018
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IEEE 1671.1-2009IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptionsstandard by IEEE, 12/11/2009
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IEEE 1671-2010IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XMLstandard by IEEE, 01/20/2011
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IEEE 1671-2006IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XMLstandard by IEEE, 12/15/2006
$43.56 $99.00 -56%In StockIEEE 1668-2017
IEEE 1668-2017IEEE Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 Vstandard by IEEE, 11/27/2017
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